DocumentCode
2301041
Title
SAR analysis of building collapse by means of the permanent scatterers technique
Author
Ferretti, A. ; Ferrucci, F. ; Prati, C. ; Rocca, F.
Author_Institution
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
Volume
7
fYear
2000
fDate
2000
Firstpage
3219
Abstract
As already shown in previous papers, detection of stable areas make it possible to use DInSAR techniques to get local measurements on a pixel-by-pixel basis. Reliable deformation measurements can then be obtained on a subset of image pixels, called Permanent Scatterers (PS). These points can be used as a “natural GPS network” to monitor terrain motion in the direction of the line of sight (LOS), analyzing the phase history of each one. In urban areas most of the PS correspond to single buildings whose deformation can be measured every 35 days with an accuracy better than one millimeter. Results obtained ERS SAR images are presented for 3 test sites: Camaiore (40 images), Milano (62 images) and Paris (64 images). Time series analysis of collapsed buildings in Camaiore are illustrated which show interesting precursory motions. Time series analysis of two metallic buildings in Milano and Paris are then used to validate the technique and to estimate its accuracy
Keywords
geophysical techniques; remote sensing by radar; surveying; synthetic aperture radar; terrain mapping; Camaiore; DInSAR; Italy; Milan; Milano; Paris; SAR; Spain; building; buildings; city; collapse; deformation; differential InSAR; geophysical measurement technique; land surface; line of sight; permanent scatterers technique; precursor; precursory motion; radar remote sensing; surveying; synthetic aperture radar; terrain mapping; terrain motion; town; urban area; Area measurement; Global Positioning System; Image motion analysis; Interferometry; Monitoring; Motion analysis; Pixel; Scattering; Synthetic aperture radar; Time series analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location
Honolulu, HI
Print_ISBN
0-7803-6359-0
Type
conf
DOI
10.1109/IGARSS.2000.860388
Filename
860388
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