• DocumentCode
    2301069
  • Title

    Software-missing piece in the integrated diagnostics puzzle

  • Author

    Nichols, David L. ; Vicen, Paul M. ; Marcum, R. Bruce

  • Author_Institution
    TRW Avionics & Surveillance Group, Dayton, OH, USA
  • fYear
    1991
  • fDate
    20-24 May 1991
  • Firstpage
    1220
  • Abstract
    It is noted that the maturity of software technologies, as they relate to integrated diagnostics, lags greatly behind hardware integrated diagnostics technologies. The authors present a case for advancing these types of software technologies. Software integrated diagnostics (SID) is defined as the subset of integrated diagnostics that concerns itself with the detection and isolation of errors in the operation of embedded software. It is recognized that errors in the operation of software may be the result of a number of causes, including requirements and design deficiencies, coding errors, hardware failures, or transient system effects. Within this context, SID concerns itself with two areas, detecting problems that manifest themselves in the software and isolating the source of the problems. The need to combine software and hardware failure isolation elevates SID to a system level function. The authors discuss an approach to developing SID technologies
  • Keywords
    aerospace computing; fault tolerant computing; military computing; program testing; Ada; coding errors; compiler generated self-check; dynamic reconfigurability; embedded software; errors detection; errors isolation; failure isolation; hardware failures; military avionics; operational flight program; software integrated diagnostics; transient system effects; Computer architecture; Computer errors; Electronic equipment testing; Error correction; Fault detection; Fault tolerant systems; Hardware; Resource management; Software maintenance; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-0085-8
  • Type

    conf

  • DOI
    10.1109/NAECON.1991.165916
  • Filename
    165916