DocumentCode :
2301319
Title :
Visualizing polycrystalline orientation microstructures with spherical color maps
Author :
Yamrom, Boris ; Sutliff, John A. ; Woodfield, Andrew P.
Author_Institution :
Gen. Electr. Corp. Res. & Dev. Center, Schenectady, NY, USA
fYear :
1994
fDate :
17-21 Oct 1994
Firstpage :
46
Abstract :
Spherical color maps can be an effective tool in the microstructure visualization of polycrystals. Electron backscatter diffraction pattern analysis provides large arrays of the orientation data that can be visualized easily using the technique described in this paper. A combination of this technique with the traditional black and white scanning electron microscopy imaging will enable scientists to better understand the correlation between material properties and their polycrystalline structure
Keywords :
backscatter; data visualisation; physics computing; scanning electron microscopy; electron backscatter diffraction pattern analysis; material properties; orientation data; polycrystalline orientation microstructures visualisation; polycrystalline structure; scanning electron microscopy imaging; spherical color maps; Backscatter; Crystalline materials; Crystals; Data visualization; Diffraction; Inorganic materials; Microstructure; Pattern analysis; Research and development; Scanning electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Visualization, 1994., Visualization '94, Proceedings., IEEE Conference on
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-6627-7
Type :
conf
DOI :
10.1109/VISUAL.1994.346338
Filename :
346338
Link To Document :
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