DocumentCode
2301496
Title
Complete vector focal field characterization via nanoprobe induced nonlinear far field signals
Author
Kupka, David ; Bartels, Randy
Author_Institution
Sch. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
fYear
2010
fDate
7-11 Nov. 2010
Firstpage
120
Lastpage
121
Abstract
An algorithm fully characterizing vector focal plane third order polarization densities and fundamental fields for tightly focused beams through analysis of far field third harmonic intensities is presented.
Keywords
focal planes; light polarisation; nanophotonics; optical focusing; optical harmonic generation; complete vector focal field characterization; far field third harmonic intensities; tightly focused beams; vector focal plane third order polarization densities;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE Photonics Society, 2010 23rd Annual Meeting of the
Conference_Location
Denver, CO
ISSN
-
Print_ISBN
978-1-4244-5368-9
Electronic_ISBN
-
Type
conf
DOI
10.1109/PHOTONICS.2010.5698787
Filename
5698787
Link To Document