DocumentCode :
2302097
Title :
Conference at a Glance
fYear :
2007
fDate :
39142
Keywords :
Circuit testing; Design for manufacture; Electronic design automation and methodology; Integrated circuit interconnections; Power system reliability; Signal design; Speech; System testing; Thermal management; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-2795-7
Type :
conf
DOI :
10.1109/ISQED.2007.51
Filename :
4148994
Link To Document :
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