DocumentCode :
2302123
Title :
Multi-Gate MOSFET Design
Author :
Knoblinger, Gerhard
Author_Institution :
Infineon Technologies
fYear :
2007
fDate :
39142
Firstpage :
3
Lastpage :
3
Abstract :
Multi-Gate Field Effect Transistors (MuGFET) such as FinFETs and Triple-Gate FETs are the most promising device structures for sub-45nm CMOS technology nodes.The superior control of the channel due to multiple gates reduces short-channel effects and leakage currents.This opens the opportunity for further down scaling of the threshold and supply voltages and device performance improvements. Circuit performance also benefits from novel gate stack materials, reduced parasitic capacitances, and hole mobility improvement.
Keywords :
CMOS technology; Circuit synthesis; Design for manufacture; Digital circuits; Electrodes; FETs; Heating; MOSFET circuits; Semiconductor device modeling; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-2795-7
Type :
conf
DOI :
10.1109/ISQED.2007.106
Filename :
4148996
Link To Document :
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