DocumentCode :
2302130
Title :
SUB 45nm Low Power Design Challenges
Author :
Tschanz, James W.
Author_Institution :
Intel
fYear :
2007
fDate :
39142
Firstpage :
4
Lastpage :
4
Abstract :
The ever-increasing use of mobile devices and the constant desire for energy efficiency and long battery life have made low power design more important than ever. At the same time, continued technology scaling results in more devices per die, higher leakage current and power densities, and increased process variations.
Keywords :
Batteries; Circuit synthesis; Energy consumption; Energy efficiency; Fabrication; Leakage current; Moore´s Law; Product design; Robustness; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-2795-7
Type :
conf
DOI :
10.1109/ISQED.2007.152
Filename :
4148997
Link To Document :
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