Title :
Quality Driven Manufacturing and SOC Designs
Author :
Venkataraman, Srikanth ; Nagapalli, Nagesh ; Jozwiak, Lech
Author_Institution :
Intel
Keywords :
Automatic test pattern generation; Automatic testing; Design for manufacture; Design for testability; Failure analysis; Manufacturing processes; Pattern analysis; Semiconductor device manufacture; Silicon; Test pattern generators;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.131
