• DocumentCode
    2302238
  • Title

    Risk-Based Testing of Safety-Critical Embedded Systems Driven by Fault Tree Analysis

  • Author

    Kloos, Johannes ; Hussain, Tanvir ; Eschbach, Robert

  • Author_Institution
    Embedded Syst. Quality Assurance, Fraunhofer IESE, Kaiserslautern, Germany
  • fYear
    2011
  • fDate
    21-25 March 2011
  • Firstpage
    26
  • Lastpage
    33
  • Abstract
    One important aspect of the quality assurance process of safety-critical embedded systems is verifying the appropriateness, correctness of the implementation and effectiveness of safety functions. Due to the rapid growth in complexity, manual verification activities are no longer feasible. This holds especially for testing. A popular method for testing such complex systems is model-based testing. Recent techniques for model-based testing do not sufficiently take into consideration the information derived from the safety analyses like Failure Mode and Effect Analysis and Fault Tree Analyses (FTA). In this paper, we describe an approach to use the results of FTA during the construction of test models, such that test cases can be derived, selected and prioritized according to the severity of the identified risks and the number of basic events that cause it. This approach is demonstrated on an example from the automation domain, namely a modular production system. We find that the method provides a significant increase in coverage of safety functions, compared to regular model based testing.
  • Keywords
    embedded systems; program testing; safety-critical software; software quality; failure mode and effect analysis; fault tree analysis; model-based testing; quality assurance process; risk-based testing; safety-critical embedded systems; Embedded systems; Fault trees; Manuals; Safety; Sensors; Testing; Fault-Tree Analysis; Model-based Testing; Risk-based Testing; Safety;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Testing, Verification and Validation Workshops (ICSTW), 2011 IEEE Fourth International Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4577-0019-4
  • Electronic_ISBN
    978-0-7695-4345-1
  • Type

    conf

  • DOI
    10.1109/ICSTW.2011.90
  • Filename
    5954386