DocumentCode :
2302269
Title :
Reconfigurable Model-Based Test Program Generator for Microprocessors
Author :
Kamkin, Alexander ; Kornykhin, Eugene ; Vorobyev, Dmitry
Author_Institution :
Software Eng. Dept., Russian Acad. of Sci., Moscow, Russia
fYear :
2011
fDate :
21-25 March 2011
Firstpage :
47
Lastpage :
54
Abstract :
Automatic generation and simulation of test programs is known to be the main means for verifying microprocessors. The problem is that test program generators for new designs are often developed from scratch with little reuse of well-tried components. State-of-the-art tools, like Genesys-Pro and RAVEN, meet the challenge by using a model-based approach, where a microprocessor model is separated from a platform-independent generation core. However, there is still a problem. Developing a microprocessor model is rather difficult and usually requires deep knowledge of the inner-core structure and interfaces. In this paper, we describe a concept of a reconfigurable test program generator being customized with the help of architecture specifications and configuration files, which describe parameters of the microprocessor subsystems (pipeline, memory, and others). The suggested approach eases the model development and makes it possible to apply the model-based testing in the early design stages when the microprocessor architecture is frequently modified.
Keywords :
automatic programming; microcomputers; reconfigurable architectures; Genesys-Pro; RAVEN; automatic generation; inner-core structure; microprocessor architecture; model-based approach; reconfigurable model-based test program generator; Automatic programming; Computer architecture; Generators; Microarchitecture; Microprocessors; Pipelines; Registers; constraint-driven random generation; functional verification; microprocessor design; model-based testing; simulation-based verification; test program generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2011 IEEE Fourth International Conference on
Conference_Location :
Berlin
Print_ISBN :
978-1-4577-0019-4
Electronic_ISBN :
978-0-7695-4345-1
Type :
conf
DOI :
10.1109/ICSTW.2011.35
Filename :
5954389
Link To Document :
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