Title :
TripleT: Improving Test Responsiveness for High Performance Embedded Systems
Author :
Mitsching, Ralf ; Weise, Carsten ; Fiedler, Frank ; Kowalewski, Stefan ; Bohnenkamp, Henrik
Author_Institution :
Embedded Software Lab., RWTH Aachen Univ., Aachen, Germany
Abstract :
Timed testing, i.e. a method of testing where timing plays a crucial role in the test verdict of the test cases, is an important quality assurance strategy in the development of embedded systems. Tool support is essential for timed testing, as timed test cases cannot be executed manually with the required precision. In case studies, we found that the existing timed testing tools do not fulfill all requirements needed for real-world-timed testing: they lack both features and responsiveness. Therefore, we have started the implementation of a timed testing tool called TripleT. TripleT is based on the notion of timed ioco as conformance relation, and uses as basis algorithms already present in TorX. However, we have improved in the responsiveness and execution time of our test cases - two major points when it comes to timeliness in timed testing. This has been achieved by using look-ahead and parallelizing the test case execution of TripleT. In the paper we will report on our approach and the results achieved.
Keywords :
embedded systems; program testing; software quality; TripleT tool; high performance embedded system; quality assurance strategy; test responsiveness; timed ioco notion; timed testing; Automata; Clocks; Embedded systems; Optimization; Testing; Timing; Embedded Systems; Timed Testing; TripleT;
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2011 IEEE Fourth International Conference on
Conference_Location :
Berlin
Print_ISBN :
978-1-4577-0019-4
Electronic_ISBN :
978-0-7695-4345-1
DOI :
10.1109/ICSTW.2011.86