Title :
Spatial Distribution of Electron Stimulated Electron Desorption from a Metal Surface
Author :
Garner, Shaoru, Jr. ; Lehman, Nathan ; Schill, Robert A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Nevada Las Vegas, Las Vegas, NV
Abstract :
Electron stimulated electron desorption yielding secondary electron emission is to be examined both experimentally and computationally. A novel secondary electron emission test stand at UNLV housing a particle position detector maps the evolution of the spatial distribution of electron beam stimulated secondary electrons emitted from a metal target. Electrons emitted from the target in the drift free region with initial momentum within an approximate 3deg<thetas<40deg conical angle of acceptance relative to the primary beam axis are collected and recorded. This allows for transient surface conditioning and degrading studies on a single pulse basis and a multi-pulse basis over time. In this preliminary study, an approximate analysis of the secondary electron emission test stand is provided with special considerations given to the detector assembly (e.g., grid, micro-channel plate, and particle position detector) and data acquisition electronics. Spatial distribution tendencies and total secondary electron emission counts are provided for a single target under test. The MAGIC modeling tool is employed to study the secondary electron emission process. Comparisons will be made with experiment.
Keywords :
data acquisition; electron beams; electron emission; electron stimulated desorption; MAGIC modeling tool; data acquisition electronics; detector assembly; drift free region; electron beam; electron stimulated electron desorption; metal surface; multipulse basis; particle position detector maps; primary beam axis; secondary electron emission test; single pulse basis; spatial distribution; transient surface conditioning; Assembly; Degradation; Delay lines; Detectors; Distributed computing; Electron beams; Electron emission; Electronic equipment testing; Materials testing; Physics;
Conference_Titel :
IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
Conference_Location :
Las Vegas, NE
Print_ISBN :
978-1-4244-1534-2
Electronic_ISBN :
978-1-4244-1535-9
DOI :
10.1109/IPMC.2008.4743642