Title :
1996 International Semiconductor Conference. 19th Edition. CAS´96 Proceedings
Abstract :
The following topics were dealt with: material characterization; silicon devices; sensors and microsystems; circuits and systems; microwaves; semiconductor optical properties; porous silicon; material processing; device simulation; integrated circuits; semiconductor physics; superlattices; process characterization; reliability; device modeling; circuit modeling and CAD; optoelectronic devices; processes and technologies
Keywords :
semiconductor materials; circuit CAD; circuit modeling; device modeling; device simulation; integrated circuits; material characterization; material processing; microsystems; microwaves; optical properties; optoelectronic devices; porous silicon; reliability; semiconductors; sensors; silicon devices; superlattices;
Conference_Titel :
Semiconductor Conference, 1996., International
Conference_Location :
Sinaia, Romania
Print_ISBN :
0-7803-3223-7
DOI :
10.1109/SMICND.1996.558406
