DocumentCode
230275
Title
Modeling methods of the test inputs for analysis the digital devices
Author
Melnik, Vladimir I. ; Mikhailov, Alexander N. ; Grishkin, Valery M. ; Ovsyannikov, Dmitri A. ; Yelaev, Yevgeny V.
Author_Institution
Open Joint Stock Co., St. Petersburg, Russia
fYear
2014
fDate
June 30 2014-July 4 2014
Firstpage
1
Lastpage
3
Abstract
The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) “SimTest” was developed so as to automate the process of digital device test-program making.
Keywords
circuit CAD; test equipment; CAD SimTest; complex digital device test check; computer-aided design system; digital device analysis; digital device test-program process; test input modeling methods; Companies; Debugging; Design automation; Electronic mail; Solid modeling; Standards; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Emission Electronics (ICEE), 2014 2nd International Conference on
Conference_Location
St. Petersburg
Type
conf
DOI
10.1109/Emission.2014.6893969
Filename
6893969
Link To Document