Title :
Multi-valued neural network and the knowledge acquisition method by the rough sets for ambiguous recognition problem
Author :
Chen, Peng ; Toyota, Toshio
Author_Institution :
Fac. of Comput. Sci. & Syst. Eng., Kyushu Inst. of Technol., Iizuka, Japan
Abstract :
Proposes a “multi-valued neural network” (MNN) which can distinguish patterns (or failure types) on the basis of the probability distributions of ambiguous feature parameters (or symptom parameters). In most cases of pattern recognition, the knowledge for the recognition are ambiguous. In these cases, the learning data (the diagnosis knowledge) for the MNN must be acquired in some way. Therefore, the knowledge acquisition method for the MNN by using rough sets is also proposed. Several examples of failure diagnosis verify that the methods are effective
Keywords :
failure analysis; knowledge acquisition; multilayer perceptrons; pattern recognition; probability; set theory; ambiguous recognition problem; diagnosis knowledge; failure diagnosis; failure types; feature parameters; knowledge acquisition method; learning data; multi-valued neural network; probability distributions; rough sets; symptom parameters; Computer science; Knowledge acquisition; Knowledge engineering; Multi-layer neural network; Neural networks; Pattern recognition; Probability distribution; Rough sets; Systems engineering and theory;
Conference_Titel :
Systems, Man, and Cybernetics, 1996., IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3280-6
DOI :
10.1109/ICSMC.1996.569886