• DocumentCode
    2302761
  • Title

    Multi-valued neural network and the knowledge acquisition method by the rough sets for ambiguous recognition problem

  • Author

    Chen, Peng ; Toyota, Toshio

  • Author_Institution
    Fac. of Comput. Sci. & Syst. Eng., Kyushu Inst. of Technol., Iizuka, Japan
  • Volume
    1
  • fYear
    1996
  • fDate
    14-17 Oct 1996
  • Firstpage
    736
  • Abstract
    Proposes a “multi-valued neural network” (MNN) which can distinguish patterns (or failure types) on the basis of the probability distributions of ambiguous feature parameters (or symptom parameters). In most cases of pattern recognition, the knowledge for the recognition are ambiguous. In these cases, the learning data (the diagnosis knowledge) for the MNN must be acquired in some way. Therefore, the knowledge acquisition method for the MNN by using rough sets is also proposed. Several examples of failure diagnosis verify that the methods are effective
  • Keywords
    failure analysis; knowledge acquisition; multilayer perceptrons; pattern recognition; probability; set theory; ambiguous recognition problem; diagnosis knowledge; failure diagnosis; failure types; feature parameters; knowledge acquisition method; learning data; multi-valued neural network; probability distributions; rough sets; symptom parameters; Computer science; Knowledge acquisition; Knowledge engineering; Multi-layer neural network; Neural networks; Pattern recognition; Probability distribution; Rough sets; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics, 1996., IEEE International Conference on
  • Conference_Location
    Beijing
  • ISSN
    1062-922X
  • Print_ISBN
    0-7803-3280-6
  • Type

    conf

  • DOI
    10.1109/ICSMC.1996.569886
  • Filename
    569886