• DocumentCode
    2302925
  • Title

    Theory of a strong double layer in a Franck-Hertz tube

  • Author

    Schamel ; Hatjimanolaki ; Nicoletopoulos

  • Author_Institution
    Bayreuth Univ., West Germany
  • fYear
    1989
  • fDate
    0-0 1989
  • Firstpage
    34
  • Lastpage
    35
  • Abstract
    Summary form only given, as follows. The formation of a stead-state electric double layer (DL) in the plasma volume inside the intergrid space of a Franck-Hertz tube has been modeled theoretically. The experimental data were accounted for by a collisionless approach involving cold beams of electrons and positive ions, and low-energy particles trapped by the potential structure. This gives rise to a narrow, strong DL provided the electron current density is large enough. It is found that the ratio, R, of the number densities of the high- and low-potential plasmas surrounding the DL must rise continuously as the electron beam energy E is increased, in order for the DL to survive, as it does, in the range swept by the accelerating potential. The manner of the rise of R(E) obtained from a self-consistent Vlasov-Poisson system provides a reasonably good description of the actual rise of this number, which is a function of atomic phenomena. Collisional effects have been incorporated. It has been shown that the DL withstands these effects and even provides a mechanism for the transition between a presheath and an aftersheath in a steady-state situation in accordance with the experimental evidence.<>
  • Keywords
    plasma collision processes; plasma density; plasma sheaths; Franck-Hertz tube; aftersheath; collisionless plasma; collisions; electron beam energy; electron current density; electrons; high-potential plasma; intergrid space; low-potential plasmas; positive ions; presheath; self-consistent Vlasov-Poisson system; stead-state electric double layer; Particle collisions; Plasma properties; Plasma sheaths;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1989. IEEE Conference Record - Abstracts., 1989 IEEE International Conference on
  • Conference_Location
    Buffalo, NY, USA
  • Type

    conf

  • DOI
    10.1109/PLASMA.1989.165955
  • Filename
    165955