Title :
Fine-Grained Redundancy in Adders
Author :
Ndai, Patrick ; Lu, Shih-Lien ; Somesekhar, Dinesh ; Roy, Kaushik
Author_Institution :
Purdue Univ., West Lafayette, IN
Abstract :
We present a technique for fault tolerance in prefix-based adders, and show its application by implementing a Kogge-Stone adder. The technique is based on the fact that an n-bit Kogge-Stone adder can be split into two independent n-bit Han-Carlson (HC) adders by augmenting an additional computation stage to the adder. The presence of single faults only affects one of these HC adders, thus we use a multiplexer to select the correct output. Moreover, the adder can correct multiple faults (up to 50% faulty nodes) as long as all the faults are located on one adder. A 64-bit version of this adder is implemented, and both area and power overhead (relative to a standard KS adder) are less 20%. If faults are present, the delay is 16%. If no faults are present, the delay of the adder is 2% relative to a KS adder
Keywords :
adders; circuit reliability; fault tolerance; redundancy; 64 bit; Han-Carlson adders; Kogge-Stone adder; fault tolerance; fine-grained redundancy; prefix-based adders; Adders; Aging; Arithmetic; Bismuth; Circuit faults; Error correction; Fault tolerance; Manufacturing processes; Redundancy; Timing;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.75