• DocumentCode
    2302935
  • Title

    Fine-Grained Redundancy in Adders

  • Author

    Ndai, Patrick ; Lu, Shih-Lien ; Somesekhar, Dinesh ; Roy, Kaushik

  • Author_Institution
    Purdue Univ., West Lafayette, IN
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    317
  • Lastpage
    321
  • Abstract
    We present a technique for fault tolerance in prefix-based adders, and show its application by implementing a Kogge-Stone adder. The technique is based on the fact that an n-bit Kogge-Stone adder can be split into two independent n-bit Han-Carlson (HC) adders by augmenting an additional computation stage to the adder. The presence of single faults only affects one of these HC adders, thus we use a multiplexer to select the correct output. Moreover, the adder can correct multiple faults (up to 50% faulty nodes) as long as all the faults are located on one adder. A 64-bit version of this adder is implemented, and both area and power overhead (relative to a standard KS adder) are less 20%. If faults are present, the delay is 16%. If no faults are present, the delay of the adder is 2% relative to a KS adder
  • Keywords
    adders; circuit reliability; fault tolerance; redundancy; 64 bit; Han-Carlson adders; Kogge-Stone adder; fault tolerance; fine-grained redundancy; prefix-based adders; Adders; Aging; Arithmetic; Bismuth; Circuit faults; Error correction; Fault tolerance; Manufacturing processes; Redundancy; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.75
  • Filename
    4149054