DocumentCode
2303004
Title
Intelligent Random Vector Generator Based on Probability Analysis of Circuit Structure
Author
Kuo, Yu-Min ; Lin, Cheng-Hung ; Wang, Chun-Yao ; Chang, Shih-Chieh ; Ho, Pei-Hsin
Author_Institution
Dept. of Comput. Sci., National TsingHua Univ., Hsinchu
fYear
2007
fDate
26-28 March 2007
Firstpage
344
Lastpage
349
Abstract
Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising
Keywords
circuit simulation; formal verification; iterative methods; probability; random number generation; benchmark circuit; circuit structure; design verification; functional verification; industrial designs; intelligent random vector generator; iterative algorithm; probability analysis; simulation-based random verification; Automatic test pattern generation; Circuit analysis; Circuit simulation; Combinational circuits; Computer bugs; Equations; Intelligent structures; Probability; Sequential circuits; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2795-7
Type
conf
DOI
10.1109/ISQED.2007.91
Filename
4149059
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