Title :
Intelligent Random Vector Generator Based on Probability Analysis of Circuit Structure
Author :
Kuo, Yu-Min ; Lin, Cheng-Hung ; Wang, Chun-Yao ; Chang, Shih-Chieh ; Ho, Pei-Hsin
Author_Institution :
Dept. of Comput. Sci., National TsingHua Univ., Hsinchu
Abstract :
Design verification has become a bottleneck of modern designs. Recently, simulation-based random verification has attracted a lot of interests due to its effectiveness in uncovering obscure bugs. Designers are often required to provide the input probabilities while conducting the random verification. However, it is extremely difficult for designers to provide accurate input probabilities. In this paper, we propose an iterative algorithm that derives good input probabilities so that the design intent can be exercised effectively for functional verification. We conduct extensive experiments on both benchmark circuit and industrial designs. The experimental results are very promising
Keywords :
circuit simulation; formal verification; iterative methods; probability; random number generation; benchmark circuit; circuit structure; design verification; functional verification; industrial designs; intelligent random vector generator; iterative algorithm; probability analysis; simulation-based random verification; Automatic test pattern generation; Circuit analysis; Circuit simulation; Combinational circuits; Computer bugs; Equations; Intelligent structures; Probability; Sequential circuits; Wire;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.91