DocumentCode :
2303065
Title :
Challenges in Evaluations for a Typical-Case Design Methodology
Author :
Kunitake, Yuji ; Chiyonobu, Akihiro ; Tanaka, Koichiro ; Sato, Toshinori
Author_Institution :
Kyushu Inst. of Technol., Kitakyushu
fYear :
2007
fDate :
26-28 March 2007
Firstpage :
374
Lastpage :
379
Abstract :
According to the current trend of increasing variations in process technologies and thus in performance, the conservative worst-case design will not work since design margins can not be provided. The authors are investigating a typical-case design methodology, where designers focus on typical cases rather than on rarely-occurring worst cases. On evaluating the typical-case design, accurate circuit delay has to be considered, which is ignored in the current architectural-level simulations. While gate-level simulations consider circuit delay, they require huge amount of simulation time and hence are inappropriate for system designs, where designers examine a wide variety of design choices. In this paper, the authors show the challenges in evaluating designs that are based on the typical-case design methodology, and build a prototype architectural-level simulator, which can estimate circuit delay within tolerable simulation time
Keywords :
delays; integrated circuit design; circuit delay; integrated circuit design; semiconductor manufacturing process; Adders; Circuit simulation; Delay effects; Delay estimation; Design methodology; Logic circuits; Microprocessors; Timing; Virtual prototyping; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
Type :
conf
DOI :
10.1109/ISQED.2007.46
Filename :
4149064
Link To Document :
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