Title :
Model Driven Mutation Applied to Adaptative Systems Testing
Author :
Bartel, Alexandre ; Baudry, Benoit ; Munoz, Freddy ; Klein, Jacques ; Mouelhi, Tejeddine ; Le Traon, Yves
Author_Institution :
Interdiscipl. Center for Security, Reliability & Trust, Univ. of Luxembourg, Luxemburg City, Luxembourg
Abstract :
Dynamically Adaptive Systems modify their behavior and structure in response to changes in their surrounding environment and according to an adaptation logic. Critical systems increasingly incorporate dynamic adaptation capabilities, examples include disaster relief and space exploration systems. In this paper, we focus on mutation testing of the adaptation logic. We propose a fault model for adaptation logics that classifies faults into environmental completeness and adaptation correctness. Since there are several adaptation logic languages relying on the same underlying concepts, the fault model is expressed independently from specific adaptation languages. Taking benefit from model-driven engineering technology, we express these common concepts in a metamodel and define the operational semantics of mutation operators at this level. Mutation is applied on model elements and model transformations are used to propagate these changes to a given adaptation policy in the chosen formalism. Preliminary results on an adaptive web server highlight the difficulty of killing mutants for adaptive systems, and thus the difficulty of generating efficient tests.
Keywords :
adaptive systems; program testing; software engineering; adaptation logic language; adaptative systems testing; adaptive Web server; disaster relief; dynamic adaptation capability; fault model; metamodel; model driven mutation; model transformation; model-driven engineering technology; mutation testing; space exploration system; Adaptation models; Adaptive systems; Context; Engines; Instruments; Testing; Web servers; MDE; adaptative systems; model driven engineering; mutation; testing;
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2011 IEEE Fourth International Conference on
Conference_Location :
Berlin
Print_ISBN :
978-1-4577-0019-4
Electronic_ISBN :
978-0-7695-4345-1
DOI :
10.1109/ICSTW.2011.24