Title :
A landmark-based approach of shape dissimilarity
Author :
van-der-Heijden, G.W.A.M. ; Vossepoel, A.M.
Author_Institution :
DLO-Centre for Plant Breeding & Reproduction Res., Wageningen, Netherlands
Abstract :
A general contour-oriented shape dissimilarity measure is shown to give unreliable answers due to the arc-length parametrization. Local differences in curve-length due to biological variation cause mismatches in the contour-representations. In many applications all objects to be compared have a basic model in common, which can often be found by the use of landmarks. In the application shown here, which was a comparison of flowers of potato-species (Solanum spp), the basic model was characterized by the five petal tips, which should be at equal intervals. By restoring the basic model for each contour before calculating the dissimilarity measures, the errors of the arc-length parametrization were considerably reduced. This resulted in more reliable and faster dissimilarity measures for the application of potato flowers
Keywords :
image restoration; object recognition; arc-length parametrization; biological variation; contour-oriented shape dissimilarity measure; landmark-based approach; petal tips; Biological system modeling; Shape measurement; Skeleton; Solids;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.546003