DocumentCode
2303154
Title
Particle-in-cell simulation of beam-electron cloud interactions
Author
Ohmi, K.
Author_Institution
KEK, Ibaraki, Japan
Volume
3
fYear
2001
fDate
2001
Firstpage
1895
Abstract
We study single bunch effects caused by an electron cloud using a simulation based on the particle-in-cell (PIC) method. The PIC method has been used for a strong-strong simulation of beam-beam effects. We apply the method to the electron cloud issues. A head-tail effect has been discussed using analysis based on coherent modes, if anything. We can treat both of coherent and incoherent effects fairly in the PIC model. We study which or how phenomenon is important in the beam-electron cloud interactions
Keywords
particle beam bunching; beam-beam effects; beam-electron cloud interactions; coherent modes; head-tail effect; incoherent effects; particle-in-cell simulation; single bunch effects; strong-strong simulation; Clouds; Ear; Electron beams; Green function; Lattices; Lenses; Magnetic fields; Particle beams; Resonance; Synchrotrons;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2001. PAC 2001. Proceedings of the 2001
Conference_Location
Chicago, IL
Print_ISBN
0-7803-7191-7
Type
conf
DOI
10.1109/PAC.2001.987219
Filename
987219
Link To Document