• DocumentCode
    2303313
  • Title

    Impact of Variability on Clock Skew in H-tree Clock Networks

  • Author

    Narasimhan, Ashok ; Sridhar, Ramalingam

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Buffalo Univ., NY
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    458
  • Lastpage
    466
  • Abstract
    Clock distribution networks play a key role in determining overall system performance. In this paper, the authors investigate the effect of parameter variations on the performance of a commonly used clock distribution structure, a H-tree clock network. The design of robust high performance clock networks face significant challenges due to increasing parameter variations in sub-65nm technologies. As shown in the results, the contribution of interconnect variations to clock skew has risen by upto 3 times from 180nm to 45nm technology. It also suggests that the effect of variability is most prominent at the second and third stages of the 5-stage H-tree clock network. This analysis will help develop mitigation techniques that focus on addressing specific failure mechanisms caused by variability in clock networks
  • Keywords
    clocks; integrated circuit design; integrated circuit interconnections; nanoelectronics; 45 to 180 nm; H-tree clock networks; clock distribution networks; clock skew; interconnect variations; Circuits; Clocks; Computer science; Design for manufacture; Error correction codes; Failure analysis; Manufacturing processes; Robustness; Semiconductor device manufacture; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.88
  • Filename
    4149078