• DocumentCode
    2303500
  • Title

    A High Performance, Scalable Multiplexed Keeper Technique

  • Author

    Kulkarni, Jaydeep P. ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette , IN
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    545
  • Lastpage
    549
  • Abstract
    This paper presents a new technique to improve performance of wide dynamic circuits by efficiently using the conditional keeper. PMOS transistor which is used to charge the dynamic node in the precharge phase is also used as a conditional keeper in the evaluation phase. The keeper functionality is merged in precharge PMOS. It is found that at same DC noise robustness; this technique gives 9% improvement in delay, 14% improvement in power and 18% improvement in clock load compared to conditional keeper technique. This technique shows zero delay penalty at higher noise immunity compared to conventional dynamic circuits. Also, this technique can be used as a burn-in tolerant keeper by adding a ´burn-in´ control signal to the multiplexed keeper without adding extra load at the dynamic node. For scaled technologies, proposed technique predicts consistent improvement in DC noise robustness compared to conventional dynamic circuits
  • Keywords
    MOS integrated circuits; SPICE; integrated circuit design; DC noise robustness; PMOS transistor; burn-in control signal; burn-in tolerant keeper; conditional keeper; multiplexed keeper technique; wide dynamic circuits; Circuit noise; Clocks; Degradation; Delay; Inverters; Leakage current; MOS devices; MOSFETs; Noise level; Noise robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.14
  • Filename
    4149091