DocumentCode
2303500
Title
A High Performance, Scalable Multiplexed Keeper Technique
Author
Kulkarni, Jaydeep P. ; Roy, Kaushik
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette , IN
fYear
2007
fDate
26-28 March 2007
Firstpage
545
Lastpage
549
Abstract
This paper presents a new technique to improve performance of wide dynamic circuits by efficiently using the conditional keeper. PMOS transistor which is used to charge the dynamic node in the precharge phase is also used as a conditional keeper in the evaluation phase. The keeper functionality is merged in precharge PMOS. It is found that at same DC noise robustness; this technique gives 9% improvement in delay, 14% improvement in power and 18% improvement in clock load compared to conditional keeper technique. This technique shows zero delay penalty at higher noise immunity compared to conventional dynamic circuits. Also, this technique can be used as a burn-in tolerant keeper by adding a ´burn-in´ control signal to the multiplexed keeper without adding extra load at the dynamic node. For scaled technologies, proposed technique predicts consistent improvement in DC noise robustness compared to conventional dynamic circuits
Keywords
MOS integrated circuits; SPICE; integrated circuit design; DC noise robustness; PMOS transistor; burn-in control signal; burn-in tolerant keeper; conditional keeper; multiplexed keeper technique; wide dynamic circuits; Circuit noise; Clocks; Degradation; Delay; Inverters; Leakage current; MOS devices; MOSFETs; Noise level; Noise robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2795-7
Type
conf
DOI
10.1109/ISQED.2007.14
Filename
4149091
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