• DocumentCode
    2303529
  • Title

    The characterisation of embedded analogue to digital converters

  • Author

    Allott, S. ; Raczkowycz, J.

  • Author_Institution
    Huddersfield Univ., UK
  • fYear
    1994
  • fDate
    6-8 Jul 1994
  • Firstpage
    163
  • Lastpage
    168
  • Abstract
    An original technique which eases the testing problems associated with embedded in silicon analogue to digital converters (ADCs) is presented. Theoretical and practical results are used to demonstrate the principles where a relationship has been developed between histogram and signal to noise ratio (SNR) data by way of an ADC model. A variable Δj is presented which may be used to characterise ADCs without creating vast amounts of data
  • Keywords
    analogue-digital conversion; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; spectral analysis; ADC model; embedded analogue to digital converters; histogram; signal to noise ratio; testing problems;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advanced A-D and D-A Conversion Techniques and their Applications, 1994. Second International Conference on
  • Conference_Location
    Cambridge
  • Print_ISBN
    0-85296-617-2
  • Type

    conf

  • DOI
    10.1049/cp:19940561
  • Filename
    346567
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2303529