Title :
The characterisation of embedded analogue to digital converters
Author :
Allott, S. ; Raczkowycz, J.
Author_Institution :
Huddersfield Univ., UK
Abstract :
An original technique which eases the testing problems associated with embedded in silicon analogue to digital converters (ADCs) is presented. Theoretical and practical results are used to demonstrate the principles where a relationship has been developed between histogram and signal to noise ratio (SNR) data by way of an ADC model. A variable Δj is presented which may be used to characterise ADCs without creating vast amounts of data
Keywords :
analogue-digital conversion; integrated circuit modelling; integrated circuit testing; mixed analogue-digital integrated circuits; spectral analysis; ADC model; embedded analogue to digital converters; histogram; signal to noise ratio; testing problems;
Conference_Titel :
Advanced A-D and D-A Conversion Techniques and their Applications, 1994. Second International Conference on
Conference_Location :
Cambridge
Print_ISBN :
0-85296-617-2
DOI :
10.1049/cp:19940561
