DocumentCode
2303538
Title
Risk-averse outsourcing strategies for optimal intellectual property protection
Author
Kim, Baejin ; Hamza, Karim ; Saitou, Kazuhiro
Author_Institution
Dept. of Mech. Eng., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2010
fDate
21-24 Aug. 2010
Firstpage
978
Lastpage
983
Abstract
This paper presents an extension of our previous work on optimal allocation of external suppliers to manage the risk of leakage in the intellectual property (IP) of a product. The optimal outsourcing decision problem is modeled as a bi-objective minimization problem with one objective being the estimated risk of loss of IP of a product due to outsourcing (IP leakage) and another being manufacturing cost of the product. A number of extensions are made in the problem formulation, including 1) unified probabilistic modeling of IP loss, 2) consideration of manufacturing process sequence to model the effect of partial observation on the compromise by a supplier, 3) modeling nonlinear effects on the increase in the probability of compromise by a supplier performing (and observing) multiple manufacturing processes, and 4) generalization to multi-supplier cases. A case study on a hinge mechanism for a cellular phone is presented, where a multi-objective genetic algorithm is used to generate the Pareto optimal supplier allocations exhibiting the trade-offs between the two objectives.
Keywords
Pareto optimisation; genetic algorithms; industrial property; minimisation; outsourcing; probability; IP leakage; IP loss probabilistic modeling; Pareto optimal supplier allocation; bi-objective minimization problem; manufacturing process sequence; multiobjective genetic algorithm; multisupplier generalization; nonlinear effects modeling; optimal external supplier allocation; optimal intellectual property protection; optimal outsourcing decision problem; risk-averse outsourcing strategy; Fasteners; IP networks; Magnetic heads; Manufacturing processes; Outsourcing; Patents;
fLanguage
English
Publisher
ieee
Conference_Titel
Automation Science and Engineering (CASE), 2010 IEEE Conference on
Conference_Location
Toronto, ON
Print_ISBN
978-1-4244-5447-1
Type
conf
DOI
10.1109/COASE.2010.5584111
Filename
5584111
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