• DocumentCode
    2303590
  • Title

    Upper/Lower Boundary Estimation of Package Interconnect Parasitics for Chip-Package Co-Design

  • Author

    Song, Eunseok ; Lee, Heeseok ; Lee, Jungtae ; Jin, Woojin ; Choi, Kiwon ; Kang, Sa-Yoon

  • Author_Institution
    Interconnect Product & Technol., Samsung Electron., Co., Ltd., Gyounggi
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    573
  • Lastpage
    579
  • Abstract
    In this paper, we introduce a new, highly accurate, package parasitics estimation technique (PME: package model estimator) that can simultaneously consider both on-chip and off-chip parasitic effects at the early stage of chip design. The performance of the proposed technique was verified by application to a substrate package designed for mass production. This paper mainly focuses on the estimation of electrical models of unrouted PCB traces in the early stage of package design by the use of the weighting factor (W) reflecting the irregular routability of a substrate design. It is clearly shown that the proposed estimation algorithm produces excellent results compared to the post-simulation models for simple as well as complicated package designs. The efficient chip-package co-design technique, which accounts for all necessary parasitic effects of the package, can accurately predict the upper and lower boundaries of the noise margin for worst cases
  • Keywords
    chip scale packaging; integrated circuit design; chip-package co-design; mass production; package interconnect parasitics; package model estimator; package parasitics estimation technique; substrate package; upper/lower boundary estimation; Chip scale packaging; Circuit noise; Crosstalk; Electronics packaging; Integrated circuit interconnections; Power system modeling; Semiconductor device noise; Semiconductor device packaging; Signal design; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.164
  • Filename
    4149097