DocumentCode :
2303590
Title :
Upper/Lower Boundary Estimation of Package Interconnect Parasitics for Chip-Package Co-Design
Author :
Song, Eunseok ; Lee, Heeseok ; Lee, Jungtae ; Jin, Woojin ; Choi, Kiwon ; Kang, Sa-Yoon
Author_Institution :
Interconnect Product & Technol., Samsung Electron., Co., Ltd., Gyounggi
fYear :
2007
fDate :
26-28 March 2007
Firstpage :
573
Lastpage :
579
Abstract :
In this paper, we introduce a new, highly accurate, package parasitics estimation technique (PME: package model estimator) that can simultaneously consider both on-chip and off-chip parasitic effects at the early stage of chip design. The performance of the proposed technique was verified by application to a substrate package designed for mass production. This paper mainly focuses on the estimation of electrical models of unrouted PCB traces in the early stage of package design by the use of the weighting factor (W) reflecting the irregular routability of a substrate design. It is clearly shown that the proposed estimation algorithm produces excellent results compared to the post-simulation models for simple as well as complicated package designs. The efficient chip-package co-design technique, which accounts for all necessary parasitic effects of the package, can accurately predict the upper and lower boundaries of the noise margin for worst cases
Keywords :
chip scale packaging; integrated circuit design; chip-package co-design; mass production; package interconnect parasitics; package model estimator; package parasitics estimation technique; substrate package; upper/lower boundary estimation; Chip scale packaging; Circuit noise; Crosstalk; Electronics packaging; Integrated circuit interconnections; Power system modeling; Semiconductor device noise; Semiconductor device packaging; Signal design; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
Type :
conf
DOI :
10.1109/ISQED.2007.164
Filename :
4149097
Link To Document :
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