• DocumentCode
    2303666
  • Title

    Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis

  • Author

    Boulé, Marc ; Chenard, Jean-Samuel ; Zilic, Zeljko

  • Author_Institution
    McGill Univ., Montreal, Que.
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    613
  • Lastpage
    620
  • Abstract
    Assertion based design, and more specifically, assertion based verification (ABV) is quickly gaining wide acceptance in the design community. Assertions are mainly targeted at functional verification during the design and verification phases. In this paper, we concentrate on the use of assertions in post-fabrication silicon debug. We develop tools that efficiently generate the checkers from assertions, for their inclusion in the debug phase. We also detail how a checker generator can be used as a means of circuit design for certain portions of self test circuits, and more generally the design of monitoring circuits. Efficient subset partitioning of checkers for a dedicated fixed-size reprogrammable logic area is developed for efficient use of dedicated debug hardware
  • Keywords
    automatic testing; formal verification; integrated circuit design; temporal logic; assertion based design; assertion based verification; assertion checkers; checker generator; circuit design; functional verification; in-field diagnosis; post-fabrication silicon debug; self test circuits; Automatic testing; Built-in self-test; Circuit simulation; Circuit synthesis; Circuit testing; Debugging; Hardware; Logic design; Monitoring; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.38
  • Filename
    4149103