DocumentCode
2303666
Title
Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis
Author
Boulé, Marc ; Chenard, Jean-Samuel ; Zilic, Zeljko
Author_Institution
McGill Univ., Montreal, Que.
fYear
2007
fDate
26-28 March 2007
Firstpage
613
Lastpage
620
Abstract
Assertion based design, and more specifically, assertion based verification (ABV) is quickly gaining wide acceptance in the design community. Assertions are mainly targeted at functional verification during the design and verification phases. In this paper, we concentrate on the use of assertions in post-fabrication silicon debug. We develop tools that efficiently generate the checkers from assertions, for their inclusion in the debug phase. We also detail how a checker generator can be used as a means of circuit design for certain portions of self test circuits, and more generally the design of monitoring circuits. Efficient subset partitioning of checkers for a dedicated fixed-size reprogrammable logic area is developed for efficient use of dedicated debug hardware
Keywords
automatic testing; formal verification; integrated circuit design; temporal logic; assertion based design; assertion based verification; assertion checkers; checker generator; circuit design; functional verification; in-field diagnosis; post-fabrication silicon debug; self test circuits; Automatic testing; Built-in self-test; Circuit simulation; Circuit synthesis; Circuit testing; Debugging; Hardware; Logic design; Monitoring; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2795-7
Type
conf
DOI
10.1109/ISQED.2007.38
Filename
4149103
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