DocumentCode
2303708
Title
Investigating Crosstalk in Sub-Threshold Circuits
Author
Nanua, Mini ; Blaauw, David
Author_Institution
Sun Microsyst. Inc., Austin, TX
fYear
2007
fDate
26-28 March 2007
Firstpage
639
Lastpage
646
Abstract
Ultra-low power designs are increasingly exploiting the sub-threshold region of operation of CMOS circuits. In order to ensure correct functionality in a design, it is necessary to guarantee signal integrity. We evaluate crosstalk in an industrial microprocessor core designed in 65nm bulk CMOS technology as the operating voltage is reduced from nominal to sub-threshold. We partition the problem into categories dictated by crosstalk analysis: crosstalk induction, crosstalk propagation and failure criterion (noise rejection curve of msff). We develop testbench circuits to study these analysis components individually. We also selected 2500 noise sensitive interconnects from the industrial microprocessor design and simulated them for crosstalk with varying operating voltages. We observe that although crosstalk injection increases in sub-threshold operation, the propagation does not, resulting in overall less crosstalk sensitive design
Keywords
CMOS integrated circuits; crosstalk; integrated circuit interconnections; microprocessor chips; CMOS circuits; bulk CMOS technology; crosstalk analysis; crosstalk induction; crosstalk propagation; failure criterion; industrial microprocessor core; signal integrity; sub-threshold circuits; testbench circuits; CMOS technology; Circuit noise; Circuit simulation; Circuit testing; Crosstalk; Failure analysis; Integrated circuit interconnections; Microprocessors; Signal design; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2795-7
Type
conf
DOI
10.1109/ISQED.2007.95
Filename
4149107
Link To Document