DocumentCode :
2303719
Title :
Analytic and Numerical Analyses of the Elctron Motion During Ion Sheath Formation
Author :
Kongyin, Gan
Author_Institution :
Lab. of FEL Res., China Acad. of Eng. Phys., Mianyang
fYear :
2008
fDate :
27-31 May 2008
Firstpage :
511
Lastpage :
511
Abstract :
Although the ion motions are very vital to the plasma immersion ion implantation, the electron motions also play the key role to sheath formation and electric filed distribution. However, only ion motion was calculated in the conventional theoretical model for PIII process, the influence of electron motion was ignored. In order to describe the ion sheath formation of the PIII process, the electron motion equation was derived based on the some assumptions, and analytical solution of the electron motion was derived in the planar target. The information related with the time to form the ion sheath, the ion sheath thickness and the electrical field distribution can be found from the analytical solution. Especially, the ion formation sheath time is found to be equal to 2.078 Ln frac12 omegape -1, where Ln is the normalized length of process chamber and omegape is the plasma electron frequency, which much larger than common estimated value omegape -1. The computer simulation of the ion sheath formation was also carried out with OOPIC Pro in order to verify the analytical analyses of the ion sheath formation. The simulation results show that the simulation is in accordance with the theoretical analyses.
Keywords :
electric fields; electrons; numerical analysis; plasma immersion ion implantation; plasma sheaths; plasma simulation; OOPIC Pro; PIII process; electric filed distribution; electron motion; ion motions; ion sheath formation; planar target; plasma electron frequency; plasma immersion ion implantation; process chamber; Analytical models; Computational modeling; Electrons; Equations; Frequency estimation; Information analysis; Motion analysis; Numerical analysis; Plasma immersion ion implantation; Plasma sheaths;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
Conference_Location :
Las Vegas, NE
Print_ISBN :
978-1-4244-1534-2
Electronic_ISBN :
978-1-4244-1535-9
Type :
conf
DOI :
10.1109/IPMC.2008.4743703
Filename :
4743703
Link To Document :
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