DocumentCode
2303751
Title
Future Prediction of Self-Heating in Short Intra-Block Wires
Author
Shinkai, Kenichi ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution
Dept. Inf. Syst. Eng., Osaka Univ.
fYear
2007
fDate
26-28 March 2007
Firstpage
660
Lastpage
665
Abstract
This paper predicts self-heating effect in a short intra-block wire will arise as a design issue with technology scaling. The short intra-block wires are close to the substrate and thought to have good thermal radiation characteristic, however, we reveal that the self-heating of short wires will be more significantly than that of global wires, and it can cause a reliability and performance degradation in the future. The max temperature rise from the ambient temperature becomes 27.3degC in a 14 nm process. Our attribution analysis also clarifies that shrinking wire cross-sectional area as well as low-k material and increased power dissipation deteriorates self-heating. Experimental results also reveal that the self-heating of local wires will be getting worse than repeater-inserted global wires
Keywords
wires (electric); low-k material; power dissipation; self-heating effect; short intra-block wires; shrinking wire cross-sectional area; technology scaling; Clocks; Design engineering; Electric resistance; Electromigration; Information systems; Systems engineering and theory; Temperature; Thermal conductivity; Thermal resistance; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2795-7
Type
conf
DOI
10.1109/ISQED.2007.82
Filename
4149110
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