• DocumentCode
    2303751
  • Title

    Future Prediction of Self-Heating in Short Intra-Block Wires

  • Author

    Shinkai, Kenichi ; Hashimoto, Masanori ; Onoye, Takao

  • Author_Institution
    Dept. Inf. Syst. Eng., Osaka Univ.
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    660
  • Lastpage
    665
  • Abstract
    This paper predicts self-heating effect in a short intra-block wire will arise as a design issue with technology scaling. The short intra-block wires are close to the substrate and thought to have good thermal radiation characteristic, however, we reveal that the self-heating of short wires will be more significantly than that of global wires, and it can cause a reliability and performance degradation in the future. The max temperature rise from the ambient temperature becomes 27.3degC in a 14 nm process. Our attribution analysis also clarifies that shrinking wire cross-sectional area as well as low-k material and increased power dissipation deteriorates self-heating. Experimental results also reveal that the self-heating of local wires will be getting worse than repeater-inserted global wires
  • Keywords
    wires (electric); low-k material; power dissipation; self-heating effect; short intra-block wires; shrinking wire cross-sectional area; technology scaling; Clocks; Design engineering; Electric resistance; Electromigration; Information systems; Systems engineering and theory; Temperature; Thermal conductivity; Thermal resistance; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.82
  • Filename
    4149110