Title :
Future Prediction of Self-Heating in Short Intra-Block Wires
Author :
Shinkai, Kenichi ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ.
Abstract :
This paper predicts self-heating effect in a short intra-block wire will arise as a design issue with technology scaling. The short intra-block wires are close to the substrate and thought to have good thermal radiation characteristic, however, we reveal that the self-heating of short wires will be more significantly than that of global wires, and it can cause a reliability and performance degradation in the future. The max temperature rise from the ambient temperature becomes 27.3degC in a 14 nm process. Our attribution analysis also clarifies that shrinking wire cross-sectional area as well as low-k material and increased power dissipation deteriorates self-heating. Experimental results also reveal that the self-heating of local wires will be getting worse than repeater-inserted global wires
Keywords :
wires (electric); low-k material; power dissipation; self-heating effect; short intra-block wires; shrinking wire cross-sectional area; technology scaling; Clocks; Design engineering; Electric resistance; Electromigration; Information systems; Systems engineering and theory; Temperature; Thermal conductivity; Thermal resistance; Wires;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.82