Title :
Comparison of confinement and loss of plasmonic waveguides
Author :
Sun, Xinghua ; Alam, M.Z. ; Aitchison, J.S. ; Mojahedi, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Abstract :
We have compared a number of well known plasmonic guides in terms of power confinement, normalized power density, and propagation loss. We have identified the relative advantages and limitations of these guides.
Keywords :
light propagation; optical losses; optical waveguides; plasmonics; normalized power density; plasmonic waveguides; power confinement; propagation loss; Density measurement; Metals; Optical waveguides; Plasmons; Power system measurements; Propagation losses; Silicon; integrated optics; mode confinement; propagation loss; surface plasmon;
Conference_Titel :
Photonics Conference (IPC), 2012 IEEE
Conference_Location :
Burlingame, CA
Print_ISBN :
978-1-4577-0731-5
DOI :
10.1109/IPCon.2012.6358773
