Title :
Effect of black copper oxide on interface adhesion between copper substrate and glob-top resin
Author :
Lebbai, M. ; Kim, J.K. ; Yuen, M.M.F. ; Tong, P.
Author_Institution :
Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., China
Abstract :
A study is made of the effects of black copper oxide coating and other plating variables on adhesion strength of glob-top resin to copper substrates for Tape Ball Grid Array (TBGA) package applications. The button shear test was performed to measure the interfacial bonding strength. Several surface analytical techniques were employed to establish the correlations between the interface bond strength and various surface parameters, such as surface free energy, chemical element, surface roughness and fracture morphology. The experimental results showed that the presence of black oxide coating (Sample C) resulted in significantly higher interface bond strength than the bare copper (Sample A) or nickel coated (Sample B) surfaces. Further processes (Samples D and E) after the black oxide coating exhibited detrimental effects, to a varying degree, on interface bond strength. The interface bond strength was approximately proportional both to surface free energy and roughness of surface finishes, indicating that wettability and mechanical interlocking both played a significant role in forming adhesion with glob top resins
Keywords :
adhesion; ball grid arrays; fracture mechanics; integrated circuit packaging; mechanical strength; plastic packaging; surface topography; Cu; adhesion strength; black oxide coating; button shear test; fracture morphology; glob-top resin; interface adhesion; interface bond strength; interfacial bonding strength; mechanical interlocking; plating variables; surface analytical techniques; surface free energy; surface parameters; surface roughness; tape ball grid array package; wettability; Adhesives; Bonding; Coatings; Copper; Resins; Rough surfaces; Surface cracks; Surface finishing; Surface morphology; Surface roughness;
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
Conference_Location :
Espoo
Print_ISBN :
0-7803-6460-0
DOI :
10.1109/ADHES.2000.860575