DocumentCode
2304066
Title
Defect detection in indirect layered manufacturing
Author
Bakhadyrov, Izzat ; Jafari, Mohsen A. ; Fang, Tong ; Safari, Ahmad ; Danforth, Stephen ; Langrana, Noshir
Author_Institution
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
Volume
5
fYear
1998
fDate
11-14 Oct 1998
Firstpage
4251
Abstract
Direct layered manufacturing (LM) is an additive manufacturing process where part is built layer by layer based on its CAD file. Indirect LM is a process where mold for a part is built by direct LM process. In this work we demonstrate a machine vision setup for surface voids detection which can be used for surface quality inspection of parts built by indirect LM and certain direct LM techniques
Keywords
automatic optical inspection; flaw detection; rapid prototyping (industrial); CAD file; additive manufacturing process; defect detection; indirect layered manufacturing; machine vision setup; surface quality inspection; surface voids detection; Application software; Ceramics; Computer vision; Filling; Inspection; Layered manufacturing; Machine vision; Manufacturing industries; Manufacturing processes; Optical materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1062-922X
Print_ISBN
0-7803-4778-1
Type
conf
DOI
10.1109/ICSMC.1998.727513
Filename
727513
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