Title :
Defect detection in indirect layered manufacturing
Author :
Bakhadyrov, Izzat ; Jafari, Mohsen A. ; Fang, Tong ; Safari, Ahmad ; Danforth, Stephen ; Langrana, Noshir
Author_Institution :
Dept. of Ind. Eng., Rutgers Univ., Piscataway, NJ, USA
Abstract :
Direct layered manufacturing (LM) is an additive manufacturing process where part is built layer by layer based on its CAD file. Indirect LM is a process where mold for a part is built by direct LM process. In this work we demonstrate a machine vision setup for surface voids detection which can be used for surface quality inspection of parts built by indirect LM and certain direct LM techniques
Keywords :
automatic optical inspection; flaw detection; rapid prototyping (industrial); CAD file; additive manufacturing process; defect detection; indirect layered manufacturing; machine vision setup; surface quality inspection; surface voids detection; Application software; Ceramics; Computer vision; Filling; Inspection; Layered manufacturing; Machine vision; Manufacturing industries; Manufacturing processes; Optical materials;
Conference_Titel :
Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-4778-1
DOI :
10.1109/ICSMC.1998.727513
