Title :
An Approach of Dynamically Test COM Components Memory Abnormity
Author :
Qu, Binbin ; Shu, Jufang ; Xie, Xiaodong ; Lu, Yansheng
Author_Institution :
Coll. of Comput. Sci. & Technol., Huangzhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
With the rapid development in the field of components based software engineering, there is a need for security testing of third-party components. Components possess characteristics such as strict encapsulation and binary code reuse, making components testing more difficult than traditional testing. In this paper, we introduce a new testing system based on dot net for dynamic monitoring COM components´ memory abnormity by debugging technique, metadata extraction technology and windows message mechanisms. The system can perform metadata extracting algorithm from components which are described by XML documents. Meanwhile, the approach of obtaining components parameters is discussed. The empirical results demonstrate that the system can effectively monitor and capture memory abnormity during run-time.
Keywords :
XML; meta data; object-oriented programming; program debugging; program testing; security of data; system monitoring; XML documents; binary code reuse; components based software engineering; components parameters; debugging technique; dynamic monitoring COM components; memory abnormity; metadata extraction technology; security testing; strict encapsulation; testing system; windows message mechanisms; Binary codes; Debugging; Encapsulation; Monitoring; Runtime; Security; Software engineering; Software testing; System testing; XML; Com components; dynamical monitoring; memory abnormity;
Conference_Titel :
Software Engineering, 2009. WCSE '09. WRI World Congress on
Conference_Location :
Xiamen
Print_ISBN :
978-0-7695-3570-8
DOI :
10.1109/WCSE.2009.261