DocumentCode :
2304131
Title :
Electro-Quasistatic High-Voltage Field Simulations of Insulator Structures Covered with Thin Resistive Pollution or Nonlinear Grading Material
Author :
Weida, Daniel ; Steinmetz, Thorsten ; Clemens, Markus
Author_Institution :
Helmut-Schmidt-Univ., Hamburg
fYear :
2008
fDate :
27-31 May 2008
Firstpage :
580
Lastpage :
583
Abstract :
In this paper, the effect of applying a thin mu-varistor material layer to composite insulator structure is presented for the rain test. In the finite-element-method (FEM) simulations, thin resistive layers are modeled as 2D surfaces instead of 3D volume bodies which helps to avoid problems within the geometric modeling process and moreover results in less degrees of freedom. Numerical simulations with this technique are presented for high voltage insulators with nonlinear field grading materials.
Keywords :
electric fields; finite element analysis; polymer insulators; varistors; FEM; composite insulator structure; electroquasistatic high-voltage field simulation; finite-element-method; geometric modeling process; high voltage insulators; insulator structures; nonlinear field grading materials; nonlinear grading material; thin mu-varistor material layer; thin resistive pollution; Composite materials; Finite element methods; Insulation; Insulator testing; Materials testing; Numerical simulation; Pollution; Rain; Solid modeling; Surface contamination; High-voltage techniques; Nonlinearities; Silicone rubber insulators; Varistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
Conference_Location :
Las Vegas, NE
Print_ISBN :
978-1-4244-1534-2
Electronic_ISBN :
978-1-4244-1535-9
Type :
conf
DOI :
10.1109/IPMC.2008.4743725
Filename :
4743725
Link To Document :
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