Title :
Data Mining of Ultraviolet Spectral Data Using a Partial Least Squares with Data Fusion
Author :
Gao, Ling ; Ren, Shouxin
Author_Institution :
Dept. of Chem., Inner Mongolia Univ., Huhhot, China
Abstract :
A novel method named DF-PLS based on partial least squares (PLS) regression combined with data fusion (DF) was applied to enhance the ability of extracting characteristic information and the quality of regression for the simultaneous spectrophotometric determination of Cu(II), Ni(II) and Cr(II). Data fusion is a technique that seamlessly integrates information from disparate source to produce a single model or decision. Wavelet representations of signals provide a local time-frequency description and are multiscale in nature, thus in the wavelet domain, the quality of noise removal are implemented by a scale-dependent threshold method. Information from different wavelet scales is just like different sources of information. Integrating the information from different wavelet scales to obtain a PLS model belongs to the technique of data fusion. PLS was applied for multivariate calibration and noise reduction by eliminating the less important latent variables. Experimental results showed the DF-PLS method to be successful for simultaneous multicomponent determination even where there was severe overlap of spectra and to be better than PLS.
Keywords :
data mining; image denoising; least squares approximations; regression analysis; sensor fusion; time-frequency analysis; wavelet transforms; data fusion; data mining; information extraction; local time-frequency description; multicomponent determination; noise removal; partial least squares; scale-dependent threshold method; spectrophotometric determination; ultraviolet spectral data; wavelet domain; wavelet representations; Calibration; Chemistry; Chromium; Data analysis; Data mining; Discrete wavelet transforms; Information resources; Least squares methods; Noise reduction; Wavelet packets; data fusion; data mining; multivariate calibration; partial least squares; wavelet multiscale;
Conference_Titel :
Education Technology and Computer Science (ETCS), 2010 Second International Workshop on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6388-6
Electronic_ISBN :
978-1-4244-6389-3
DOI :
10.1109/ETCS.2010.166