DocumentCode :
2304262
Title :
Performance of the stud bump bonding (SBB) process in comparison to solder flip chip technology
Author :
Reinert, W. ; Harder, T.
Author_Institution :
Fraunhofer ISIT, Itzehoe, Germany
fYear :
2000
fDate :
2000
Firstpage :
136
Lastpage :
140
Abstract :
In flip chip on board, a flip chip packaging technology, a number of assembly techniques have been proposed using different bump materials, different techniques for the bump application and various methods for the electrical interconnection. Among these, the Stud Bump Bonding (SBB) process, which is widely used in Japan also for high volume production, is very interesting for several reasons and therefore is discussed in this paper. The stud bump bonding process uses Au bumps which are applied mechanically on the wafer or on the chip using a thermosonic ball bonder enabling fine pitch bumping. The process works with available chips, having peripheral bond pads of a pitch down to 80 μm, and does not need an under bump metallization (UBM). The SBB process with Au bumps uses mainly isotropically conductive adhesive (ICA) joining. The adhesive is applied by dip transfer. In the present work the total SBB process is evaluated. Besides the bumping, the flip chip assembly process covering the dip transfer of conductive adhesive, the pick and place as well as the underfill process are investigated with special emphasis on process automation. The reliability evaluation concentrates on thermo-mechanical and corrosion effects. The SBB process is compared to solder flip chip technology using solder bumps which are applied by the stencil printing of ultra-fine-pitch solder paste
Keywords :
adhesives; assembling; circuit reliability; corrosion; fine-pitch technology; flip-chip devices; gold; integrated circuit bonding; printed circuit manufacture; surface mount technology; 80 micron; Au; Au bumps; assembly techniques; bump application; bump materials; corrosion effects; dip transfer adhesive application; electrical interconnection; fine pitch bumping; flip chip assembly process; flip chip on board packaging technology; high volume production; isotropically conductive adhesive joining; peripheral bond pads; pick/place process; process automation; reliability evaluation; solder flip chip technology; stud bump bonding process; thermo-mechanical effects; thermosonic ball bonder; underfill process; Assembly; Bonding processes; Conductive adhesives; Flip chip; Gold; Independent component analysis; Metallization; Packaging; Production; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
Conference_Location :
Espoo
Print_ISBN :
0-7803-6460-0
Type :
conf
DOI :
10.1109/ADHES.2000.860587
Filename :
860587
Link To Document :
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