Title :
Optimizing Checking-Logic for Reliability-Agnostic Control of Self-Calibrating Designs
Author :
Worm, Frédéric ; Thiran, Patrick ; Ienne, Paolo
Author_Institution :
Sch. of Comput. & Commun. Sci., Ecole Polytechnique Federate de Lausanne
Abstract :
Self-calibrating designs have recently gained momentum as an alternative to methods relying on worst-case characterisation of silicon (Das et al., 2006), (Kim et al., 2005), (Worm et al., 2005), So far, reliable operation of existing link checkers - double sampling flip-flops or code-based - is not ensured over the whole range of bit error rate. Therefore, bit error rates where the checker reliability is poor are avoided either by worst-case characterisation of the link error rate (such as for double sampling flip-flops), or by constraining the operating point controller to avoid such regions (such as for code-based checkers). This paper proposes a novel checker architecture that bridges the gap between low overhead and high robustness over the whole error rate range. Specifically, the paper shows how to combine optimally double sampling flip-flops with a code-based checker (in point of reliability). The resulting checker enables simple, efficient, and reliability-agnostic operating point control policies
Keywords :
error statistics; flip-flops; logic circuits; reliability; bit error rate; code-based checkers; double sampling flip-flops; link checkers; operating point controller; optimizing checking-logic; reliability-agnostic control; self-calibrating designs; Bit error rate; Circuits; Design optimization; Error analysis; Error correction; Flip-flops; Robustness; Sampling methods; Silicon; Voltage control;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.113