DocumentCode :
2304351
Title :
Applicability of no-flow fluxing encapsulants and flip chip technology in volume production
Author :
Palm, Petteri ; Puhakka, Kimmo ; Maattanen, Jarmo ; Heimonen, Tanja ; Tuominen, Aulis
Author_Institution :
Elcoteq Network Corp., Lohja, Finland
fYear :
2000
fDate :
2000
Firstpage :
163
Lastpage :
167
Abstract :
Applicability of no-flow fluxing encapsulants and flip chip technology in volume production was studied. Adhesion of the underfill materials to different solder resists was measured with single lap shear test and the results compared with traditional underfills. No-flow underfiller was dispensed with standard in line dispenser. SnPb-bumped flip chip test structures were pick and placed on FR4 substrates by using standard volume production line. The bump pitch of the test chips was 250 μm. Sample boards were also precured in standard production oven and postcured in baking oven. No-flow underfillers showed exceptionally good adhesion to used solder resists. With the no-flow underfillers flip chip proved to be transparent to the current SMA process, however the process window for dispensing and reflowing is relatively narrow
Keywords :
adhesion; encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit testing; production testing; soldering; surface mount technology; 250 micron; SnPb; adhesion; bump pitch; flip chip technology; flip chip test structures; lap shear test; no-flow fluxing encapsulants; no-flow underfiller; postcure; precure; process window; production oven; reflowing; solder resists; standard in line dispenser; standard volume production line; underfill materials; volume production; Adhesives; Assembly; Flip chip; Materials reliability; Ovens; Packaging; Production; Resists; Space technology; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
Conference_Location :
Espoo
Print_ISBN :
0-7803-6460-0
Type :
conf
DOI :
10.1109/ADHES.2000.860592
Filename :
860592
Link To Document :
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