• DocumentCode
    2304393
  • Title

    Applying polymer process studies using molecular modeling

  • Author

    Iwamoto, N.E.

  • Author_Institution
    Honeywell, San Diego, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    182
  • Lastpage
    187
  • Abstract
    Although process studies are usually done experimentally within the microelectronics board and packaging industry, at Honeywell we have been concerned about facilitating such studies though use of molecular-scale simulation support. For instance, we have used bleed modeling for several years now to understand and target bleed modification additives and to help us predict the effect of both organic and inorganic components on underfill flow. In a similar strategy we have used an adhesion modeling extension to understand stress cycling reliability, and to predict the relative ability of our formulations to withstand thermal cycling. Most recently we have used thermal cycling to help us understand process differences in several resin coated copper foils used in circuit board manufacture. All of these studies have demonstrated usefulness in understanding specific interfacial mechanisms that could not be understood from larger scale simulations or experimental evidence alone. As these studies encompass aspects of both the pre-cure and post-cure state of the adhesive, they require different assumption bases as well as different methodologies to address the performance issues. In this paper we will discuss the strategies applied, their results in in-house formulation and the impacts of using the molecular perspective to increase adhesive understanding in a development scenario
  • Keywords
    adhesives; conducting polymers; encapsulation; printed circuit manufacture; reliability; thermal analysis; adhesion modeling extension; bleed modeling; circuit board manufacture; interfacial mechanisms; molecular modeling; molecular-scale simulation support; polymer process studies; post-cure state; pre-cure state; resin coated copper foils; stress cycling reliability; thermal cycling; underfill flow; Additives; Adhesives; Copper; Microelectronics; Packaging; Polymers; Predictive models; Printed circuits; Resins; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
  • Conference_Location
    Espoo
  • Print_ISBN
    0-7803-6460-0
  • Type

    conf

  • DOI
    10.1109/ADHES.2000.860595
  • Filename
    860595