Title :
Novel time-resolved measurements of bit-error-rate and optical-signal-to-noise-ratio degradations due to EDFA gain dynamics in a WDM network
Author :
Wong, William S. ; Tsai, Huan-Shang ; Chen, Chien-Jen ; Lee, Hak Kyu ; Ho, Min-Chen
Author_Institution :
Onetta Inc., Sunnyvale, CA, USA
Abstract :
Summary form only given. We demonstrated the usefulness of a new technique for making time-resolved measurements of BER and OSNR. As an example, we measured the OSNR and the BER of a surviving channel as the channel loading was varied by 100%. A severe drop of 5 dB in OSNR was observed despite the fact that the channel power decreased by 3 dB only.
Keywords :
erbium; error statistics; high-speed optical techniques; laser noise; optical communication equipment; optical fibre amplifiers; optical fibre networks; optical fibre testing; wavelength division multiplexing; BER; EDFA gain dynamics; OSNR; WDM network; bit-error-rate; channel loading; channel power; optical-signal-to-noise-ratio degradations; surviving channel; time-resolved measurements; Bit error rate; Degradation; Erbium-doped fiber amplifier; Gain measurement; Intelligent networks; Optical attenuators; Optical fiber networks; Stimulated emission; Ultrafast optics; WDM networks;
Conference_Titel :
Optical Fiber Communication Conference and Exhibit, 2002. OFC 2002
Print_ISBN :
1-55752-701-6
DOI :
10.1109/OFC.2002.1036524
