MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments

The paper presents a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices according to cell area and considers the effect of multiple faults within a circuit. Furthermore this methodology measures circuit operation over a range of environments and consequently provides a means of targeting designs to the expected operating environment rather than worst case. The authors demonstrate the effect area has on circuit reliability and fault tolerance