Title :
Mechanics of polymer/metal interfaces in microelectronic packaging
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Summary form only given, as follows. The loss of interfacial adhesion is mostly seen in the failure of adhesive joints. The interfacial adhesion strength is believed to highly depend on a number of parameters, such as surface topology and treatment, adhesive chemistry/structure, rheological properties of the solids, and elastic mismatch across the interface. Thermal mismatch between polymer adhesive and adherend also has considerable effect on adhesion. Surface science provides modern tools to quantify the thermodynamic work of adhesion (microscopic adhesion energy) through surface contact angle measurement, while fracture mechanics enables the measurement of the interfacial fracture toughness (macroscopic energy density) through various experimental techniques. The objectives of this work are (i) to understand how the thermodynamic work of adhesion is related to the fracture toughness, and (ii) what and how other factors (crack tip plasticity, surface roughness, residual stresses, etc.) affect the fracture toughness
Keywords :
adhesion; failure analysis; fracture mechanics; fracture toughness; integrated circuit packaging; internal stresses; rheology; surface topography; adhesive chemistry; adhesive joints; crack tip plasticity; elastic mismatch; failure; fracture mechanics; interfacial adhesion; interfacial fracture toughness; macroscopic energy density; microelectronic packaging; polymer/metal interfaces; residual stresses; rheological properties; surface contact angle measurement; surface roughness; surface topology; Adhesives; Density measurement; Energy measurement; Mechanical variables measurement; Microelectronics; Packaging; Polymers; Surface cracks; Surface treatment; Thermodynamics;
Conference_Titel :
Adhesive Joining and Coating Technology in Electronics Manufacturing, 2000. Proceedings. 4th International Conference on
Conference_Location :
Espoo
Print_ISBN :
0-7803-6460-0
DOI :
10.1109/ADHES.2000.860613