DocumentCode :
2304867
Title :
Determining the similarity of point patterns using internal, nonmetric representations: preliminary results
Author :
Kreifeldt, John G. ; Levine, Stephen H. ; Nah, Keoun ; Liu, Lin
Author_Institution :
Dept. of Mech. Eng., Tufts Univ., Medford, MA, USA
Volume :
5
fYear :
1998
fDate :
11-14 Oct 1998
Firstpage :
4492
Abstract :
Point patterns can be represented by rank ordered lists of interpoint distances. This use of ordinal (i.e. nonmetric) information, combined with the independence of the representation from any coordinate system, means that the resulting representation, and reconstruction as well, is indifferent to scale, translation, rotation, and reflection. This paper focuses on establishing a measure of similarity between non-identical patterns of P points. In doing so, it considers two cases. The first, and simpler, includes an a priori specification of the point correspondences between the two patterns; in the second no such a priori specification is made and it thus requires first determining the best assignment of point correspondences
Keywords :
image reconstruction; image representation; pattern recognition; interpoint distances; point correspondences; point patterns; rank ordered lists; reconstruction; representation; Educational institutions; Mean square error methods; Mechanical engineering; Multidimensional systems; Reflection; Stress measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Conference_Location :
San Diego, CA
ISSN :
1062-922X
Print_ISBN :
0-7803-4778-1
Type :
conf
DOI :
10.1109/ICSMC.1998.727558
Filename :
727558
Link To Document :
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