• DocumentCode
    230494
  • Title

    Monolithic three-dimensional integration of carbon nanotube FETs with silicon CMOS

  • Author

    Shulaker, Max M. ; Saraswat, Krishna ; Wong, H.-S Philip ; Mitra, Subhasish

  • Author_Institution
    Stanford Univ., Stanford, CA, USA
  • fYear
    2014
  • fDate
    9-12 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate the first VLSI-compatible approach for monolithic three-dimensional (3D) integration of carbon nanotube field effect transistors (CNFETs) with silicon CMOS for high-performance digital logic applications. Fine-grained monolithic 3D integration is demonstrated at the logic gate level, whereby individual logic gates are composed of both CNFETs and silicon FETs. Monolithic 3D integration is additionally achieved at the circuit-level, with CNFET logic gates cascaded with silicon CMOS logic gates, creating hybrid CNFET-silicon CMOS logic circuits. All the CNFET fabrication steps are VLSI-scalable and silicon CMOS compatible. CNFET fabrication is performed after the silicon CMOS processing is completed and the CNFETs directly overlap on top of the silicon FETs. This work demonstrates both the compatibility of CNFETs with silicon CMOS and the ability to achieve monolithic 3D ICs simultaneously using silicon CMOS and CNFETs.
  • Keywords
    CMOS logic circuits; VLSI; carbon nanotube field effect transistors; integrated circuit interconnections; three-dimensional integrated circuits; CNFET logic gates; VLSI; carbon nanotube FET; digital logic applications; hybrid CNFET-silicon CMOS logic circuits; monolithic 3D IC; monolithic 3D integration; silicon CMOS logic gates; silicon FET; CMOS integrated circuits; CNTFETs; Inverters; Logic gates; Silicon; Three-dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4799-3331-0
  • Type

    conf

  • DOI
    10.1109/VLSIT.2014.6894422
  • Filename
    6894422