Title :
(Sr,Ca)TiO3 based multi-functional ceramics with alkaline metallic cations diffusion
Author :
Qing, Zou ; Yangchum, L. ; Zhongyan, Meng
Author_Institution :
Dept. of Electron. Eng., Xian Jiaotong Univ., China
Abstract :
Nb5+-doped (Sr,Ca)TiO3-based capacitor-varistor ceramics were sintered in a reducing atmosphere, coated with Li+, Na+, or K+ alkaline solution, and annealed in air. The electrical behavior is significantly dependent on the thermal diffusion conditions. The microstructure of (Sr,Ca)TiO3 based ceramics is composed of grains, a diffusion layer at the grain boundaries, and a precipitated small crystal at triple points, such as the Magneli phase of rutile TiO2 with Al, Si. No secondary phase between the grains was observed. The diffusion layer in the range 0.3~2 μm is considered to be caused by the diffusion of alkaline metallic cation and oxygen chemisorption on grain surfaces and to be significantly dependent on thermal diffusion conditions. A back-to-back Schottky barrier sandwich model is presented. Based on this model, the barrier height is estimated from simulation of the C-V characteristics to be about 0.4~0.8 eV
Keywords :
Schottky barriers; annealing; calcium compounds; ceramic capacitors; ceramics; chemisorption; grain boundary diffusion; niobium; scanning electron microscopy; sintering; strontium compounds; thermal diffusion; transmission electron microscopy; varistors; 0.4 to 0.8 eV; C-V characteristics; Magneli phase; SrTiO3CaTiO3 ceramics; SrTiO3CaTiO3:Nb; alkaline metallic cations diffusion; annealing; back-to-back Schottky barrier sandwich model; barrier height; capacitor-varistor ceramics; chemisorption; electrical behavior; grain boundaries; grain surfaces; multi-functional ceramics; precipitated small crystal; reducing atmosphere; sintering; thermal diffusion conditions; triple points; Additives; Atmosphere; Atmospheric modeling; Capacitance-voltage characteristics; Ceramics; Coatings; Grain boundaries; Microstructure; Schottky barriers; Threshold voltage;
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
DOI :
10.1109/ECTC.1993.346697