DocumentCode :
2305601
Title :
A novel chip replacement method for encapsulated flip chip bonding
Author :
Tsukada, Yutaka ; Mashimoto, Yohko ; Watanuki, Noriyuki
Author_Institution :
Yasu Technol. Appl. Lab., IBM Japan Ltd., Shiga, Japan
fYear :
1993
fDate :
1-4 Jun 1993
Firstpage :
199
Lastpage :
204
Abstract :
In FCA (Flip Chip Attach) technology, the encapsulation for the flip chip joints relieves the stress which is supposed to be concentrated on these joints by the thermal cycling of the system. It allows us to use low cost-material such as epoxy for a carrier of flip chip bonding though it has significantly higher CTE than ceramic. However, the chip replacement after encapsulation becomes difficult when it is found to be defective. To resolve this problem, we have developed a simple replacement technique. In this technique, the encapsulated chip for replacement is ground off with about a half height of encapsulation. After providing carrier bumps with solder injection, a new chip is placed and the joining cycle is followed with the same manner of initial chip join. The reliability of the joints showed the same level as the initially built joints. This technique can be applied for the replacement of any kind of encapsulated flip chip bonding
Keywords :
encapsulation; flip-chip devices; integrated circuit packaging; reflow soldering; thermal expansion; thermal stresses; CTE; FCA; carrier bumps; chip replacement method; encapsulated flip chip bonding; epoxy; flip chip attach; thermal cycling; Bonding; Ceramics; Costs; Encapsulation; Flip chip; Joining materials; Space technology; Temperature; Testing; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
Type :
conf
DOI :
10.1109/ECTC.1993.346719
Filename :
346719
Link To Document :
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