DocumentCode :
2305739
Title :
Reflow soldering evaluation of lead free solder alloys
Author :
Melton, Cindy
Author_Institution :
Motorola Inc., Schaumburg, IL, USA
fYear :
1993
fDate :
1-4 Jun 1993
Firstpage :
1008
Lastpage :
1011
Abstract :
A quantitative dynamic solder wettability measurement was used to evaluate the effects of reflow processing on the wettability parameters associated with the nonlead bearing solders 96.5% Sn/3.5% Ag and 58% Bi/42% Sn. An experimental design approach employing full factorial experiments was formulated to investigate the solder wetting dependence of the reflow parameters, atmosphere, peak reflow temperature, time above liquidus, and metallization. Solder wettability was determined with respect to the final degree of spread and the extent of solder wetting onto the lands of surface mount components. The solder alloy composition of 96.5% Sn/3.5% Ag was found to exhibit better wetting characteristics than the 58% Bi/42% Sn alloy. This wetting behavior was enhanced under the reflow conditions of a nitrogen atmosphere and the use of a gold metallization. The wetting of the conventional 63% Sn/37% Pb solder alloy was improved over the comparatively processed 58% Bi/42% Sn alloy. However, the 63% Sn/37% Pb solder alloy displayed a greater sensitivity to reflow atmosphere than the 96.5% Sn/3.5% Ag alloy, which generally exhibited better wetting characteristics than the Sn/Pb alloy
Keywords :
bismuth alloys; silver alloys; soldering; tin alloys; wetting; Au; Au metallization; Bi-Sn; N atmosphere; N2; Sn-Ag; dynamic solder wettability measurement; lead free solder alloys; nonlead bearing solders; peak reflow temperature; reflow soldering evaluation; solder alloy composition; time above liquidus; wettability parameters; Atmosphere; Bismuth; Design for experiments; Environmentally friendly manufacturing techniques; Lead; Metallization; Reflow soldering; Temperature dependence; Time measurement; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
Type :
conf
DOI :
10.1109/ECTC.1993.346729
Filename :
346729
Link To Document :
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