DocumentCode :
2305787
Title :
Critical parameters for achieving optimum reflow profiles for plastic package preconditioning
Author :
Hong, K.D. ; Lee, S.S. ; Kim, J.Y. ; Daniel, S. ; Yoon, C.K.
Author_Institution :
Quality Assurance Sector, Samsung Electronics Co. Ltd., Kyungki-Do, South Korea
fYear :
1995
fDate :
4-6 April 1995
Firstpage :
85
Lastpage :
92
Abstract :
Temperature profiles of surface mount components progressing through convection and infrared reflow systems are studied with respect to package size, inter-component spacing, and loading density. For constant forcing temperature, T/sub max/ varies inversely with component mass. A minimum component spacing required to minimize T/sub max/ variation is established. Package delamination and cracking are shown to depend primarily on T/sub max/.
Keywords :
assembling; cracks; delamination; integrated circuit packaging; integrated circuit reliability; plastic packaging; reflow soldering; surface mount technology; component mass; constant forcing temperature; convection systems; infrared reflow systems; inter-component spacing; loading density; optimum reflow profiles; package cracking; package delamination; package size; plastic package preconditioning; surface mount components; temperature profiles; Assembly; Electronics packaging; Heat transfer; Heating; Manufacturing processes; Plastic packaging; Semiconductor device packaging; Soldering; Surface cracks; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1995. 33rd Annual Proceedings., IEEE International
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2031-X
Type :
conf
DOI :
10.1109/RELPHY.1995.513659
Filename :
513659
Link To Document :
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